Standard Test Method for
Application of Ionization Chambers to Assess the Low
Energy Gamma Component of Cobalt-60 Irradiators Used in
Radiation-Hardness Testing of Silicon Electronic Devices1
This standard is issued under the fixed designation E 1250; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
Click below to download Astm E 1250 – 88 (Reapproved 2000) Pdf free
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