Standard Test Method for
Measuring Transistor and Diode Leakage Currents1
This standard is issued under the fixed designation F 769; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
Click below to download Astm F 769 – 00 Pdf free
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Click here to Astm F 767 – 98 (Reapproved 2002) Pdf free download